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4192a lf impedance analyzer  (Agilent technologies)


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    Agilent technologies 4192a lf impedance analyzer
    4192a Lf Impedance Analyzer, supplied by Agilent technologies, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/4192a+lf+impedance+analyzer/pmc11104484-94-18-17
    Average 90 stars, based on 1 article reviews
    4192a lf impedance analyzer - by Bioz Stars, 2026-11
    90/100 stars

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    Article Title: Electretized sheet and filter
    Article Snippet: Examples of such a measurement apparatus include “4192A LF IMPEDANCE ANALYZER” from Agilent Technologies, Inc., “LCR Meter 4274A” from Yokogawa Electric Corp., and “HIOKI 3522 LCR Hitester” from Hioki E.E.

    Article Title: Electrostatic adsorbable sheet
    Article Snippet: For the measurement of relative dielectric constant of the support layer (ii) of the present invention, using “4192A LF IMPEDANCE ANALYZER” of Agilent Technologies, under an environmental conditions at a temperature of 23° C. and a relative humidity of 50%, a sample larger than the electrode diameter is sandwiched between a main electrode having a diameter of 38 mm and a counter electrode having a diameter of 56 mm so that a surface having a high surface resistivity faces to the main electrode side, a voltage of 5V is applied, measurement is performed at a frequency ranging from 10 Hz to 1 MHz, and a measured value at a frequency of 100 Hz is taken as a representative value.

    Article Title: Robust multiferroicity and magnetic modulation of the ferroelectric imprint field in heterostructures comprising epitaxial Hf 0.5 Zr 0.5 O 2 and Co.
    Article Snippet: Magnetocapacitance measurements have been performed at 100 kHz with an excitation voltage of 300 mV using an Agilent 4192A LF impedance analyzer.

    Article Title: Robust multiferroicity and magnetic modulation of the ferroelectric imprint field in heterostructures comprising epitaxial Hf 0.5 Zr 0.5 O 2 and Co
    Article Snippet: Magnetocapacitance measurements have been performed at 100 kHz with an excitation voltage of 300 mV using an Agilent 4192A LF impedance analyzer.

    Article Title: CaF 2 solid‐state electrolytes prepared by vapor pressure exposure and solid synthesis for defect and ionic conductivity tuning
    Article Snippet: They were gold coated on both sides utilizing a sputtering device (JEOL, sputter coater) and were further investigated by impedance measurements with an Agilent 4192A LF impedance analyzer applying a frequency range from 5 Hz to 13 MHz with a voltage amplitude of 10 mV11.

    Article Title: Electrophotographic recording sheet and recorded material
    Article Snippet: For measurement of the electrostatic capacity of the electrophotographic recording sheet of the invention, used is Agilent Technologies' “4192A LF IMPEDANCE ANALYZER”.

    Article Title: Mechanochemical synthesis of solid-state electrolyte Sm1−xCaxF3−x for batteries and other electrochemical devices
    Article Snippet: Solid-state secondary batteries employing solid electrolytes provide the advantage to be potentially more stable than conventional batteries and hence safer.. At present, investigations of related ionic conductivities of solid ion conductors are attracting attention.. In this work, we have prepared SmF3 with CaF2 doped materials.

    Article Title: Advanced Architecture for Colloidal PbS Quantum Dot Solar Cells Exploiting a CdSe Quantum Dot Buffer Layer.
    Article Snippet: Subscriber access provided by Northern Illinois University ACS Nano is published by the American Chemical Society.. 1155 Sixteenth Street N.W., Washington, DC 20036 Published by American Chemical Society.. Copyright © American Chemical Society.



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